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Call: 440-892-9277 Fax: 440-808-2202 Contact Form |
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Optically, Bruker's white light interfermetric (WLI) and confocal optical profilers offer a full range of fast, non-contact analyses. Sample sizes can range from microscopic MEMS to entire engine blocks. White light systems feature patented, higher brightness dual-LED illumination that, when combined with Bruker's superior vertical resolution, provide the high sensitivity and stability necessary for precision, non-contact 3D surface metrology in applications and environments that are challenging for other metrology systems.
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Designed
for Inspection Engineering®
Last updated February 25, 2012